We are looking for HiWi / Bachelor- and Masterstudents in the domain of testing and reliability of RRAMs for the development of new test strategies, including the development of fault models based on manufacturing defects.
Tasks:
- Development of fault model based on manufacturing defects considering the material and structural deviations
- Development of test procedures for RRAMs
Requirements:
- Basic understanding of memristive devices and testing theory
- Strong knowledge in CMOS technology - microelectronics
- Strong knowledge in circuit simulation (such as HSPICE)
Person to Contact: Prof. Dr. Leticia Maria Bolzani Poehls
Inside the RWTH network you can find more detailed information here.