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We are looking for HiWi / Bachelor- and Masterstudents in the domain of testing and reliability of RRAMs for the development of new test strategies, including the development of fault models based on manufacturing defects.  


  • Development of fault model based on manufacturing defects considering the material and structural deviations
  • Development of test procedures for RRAMs


  • Basic understanding of memristive devices and testing theory
  • Strong knowledge in CMOS technology - microelectronics
  • Strong knowledge in circuit simulation (such as HSPICE)


Person to Contact: Prof. Dr. Leticia Maria Bolzani Poehls

Inside the RWTH network you can find more detailed information here.