Publikationen 2021

  1. Jianan Wen, Markus Ulbricht, Eduardo Perez, Xin Fan and Milos Krstic.
    Behavioral Model of Dot-Product Engine Implemented with 1T1R Memristor Crossbar Including Assessment.
    In 2021 24th International Symposium on Design and Diagnostics of Electronic Circuits $&$ Systems (DDECS). April 2021.
    URL, DOI

  2. Kevin Kauth, Tim Stadtmann, Ruben Brandhofer, Vida Sobhani and Tobias Gemmeke.
    Communication Architecture Enabling 100x Accelerated Simulation of Biological Neural Networks.
    In Proceedings of the Workshop on System-Level Interconnect: Problems and Pathfinding Workshop. November 2020, 2, 1-8.
    URL, DOI

  3. Cardoso G Medeiros, M Fieback, A Gebregiorgis, M Taouil, Leticia Bolzani Poehls and S Hamdioui.
    Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs.
    In Proceedings, 2021 IEEE European Test Symposium (ETS) : ETS 2021 : May 24-28, 2021, Belgium. Mai 2021, 6 Seiten.
    URL, DOI

  4. Cecilia Ishtar Durga Latotzke and Tobias Gemmeke.
    Efficiency Versus Accuracy: A Review of Design Techniques for DNN Hardware Accelerators.
    IEEE access 9:9785-9799, 2021.
    URL, DOI

  5. Tobias Gemmeke, Johnson Luo Loh, Cecilia Höffler, Anke Schmeink and Ahmad Said Yousf Ayad.
    Energieoptimierte Vorrichtung zur Klassifizierung von Daten.
    2021.
    URL

  6. E Brum, M Fieback, Thiago Santos Copetti, H Jiayi, S Hamdioui, F Vargas and Bolzani L M Poehls.
    Evaluating the Impact of Process Variation on RRAMs.
    In [2021 IEEE 22nd Latin American Test Symposium, LATS, 2021-10-27 - 2021-10-29, Punta del Este, Uruguay]. Oktober 2021.
    URL, DOI

  7. Thiago Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Letícia Bolzani Poehls and Tiago Balen.
    Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects.
    Journal of electronic testing 37(3):383-394, 2021.
    URL, DOI

  8. Guilherme Cardoso Medeiros, Moritz Fieback, Lizhou Wu, Mottaqiallah Taouil, Leticia Maria Bolzani Poehls and Said Hamdioui.
    Hard-to-Detect Fault Analysis in FinFET SRAMs.
    IEEE transactions on very large scale integration (VLSI) systems 29(6):1271-1284, 2021.
    URL, DOI

  9. G C Medeiros, M Fieback, Thiago Santos Copetti, A Gebregiorgis, M Taouil, Letícia Bolzani Pöhls and S Hamdioui.
    Improving the Detection of Undefined State Faults in FinFET SRAMs.
    In 2021 16th International Conference on Design $&$ Technology of Integrated Systems in Nanoscale Era (DTIS), 28-30 June 2021. Juni 2021, 6 Seiten.
    URL, DOI

  10. Xin Fan, Milan Babic, Shutao Zhang, Eckhard Grass and Milos Krstic.
    Plesiochronous Spread Spectrum Clocking With Guaranteed QoS for In-Band Switching Noise Reduction.
    IEEE transactions on circuits and systems / 1 68(7):3031-3043, 2021.
    URL, DOI

  11. Leticia Maria Bolzani Poehls, M C R Fieback, S Hoffmann-Eifert, T Santos Copetti, E Brum, Stephan Menzel, S Hamdioui and Tobias Gemmeke.
    Review of Manufacturing Process Defects and Their Effects on Memristive Devices.
    Journal of electronic testing 37(4):427-437, 2021.
    URL, DOI

  12. Rawan Naous, Anne Siemon, Michael Schulten, Hamzah Alahmadi, Andreas Kindsmüller, Michael Lübben, Arne Heittmann, Rainer Waser, Khaled Nabil Salama and Stephan Menzel.
    Theory and experimental verification of configurable computing with stochastic memristors.
    Scientific reports 11:4218, 2021.
    URL, DOI

  13. Thiago Santos Copetti, Tobias Gemmeke and Letícia Bolzani Pöhls.
    Validating a DFT Strategy’s Detection Capability regarding Emerging Faults in RRAMs.
    In Proceedings of the 2021 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC) : VLSI : virtual conference - 4-8 October 2021, Singapore, Nanyang Technological University Center / conference general co-chairs: Anupam Chattopadhyay (Nanyang Technological University, Singapore) and Andrea Calimera (Politecnico di Torino, Italy); publisher: IEEE. Oktober 2021.
    URL, DOI