We are looking for HiWi / Bachelor- and Masterstudents in the domain of testing and reliability of RRAMs for the development of new test strategies, including the development of fault models based on manufacturing defects.  

Tasks:

• Development of fault model based on manufacturing defects considering the material and structural deviations
• Development of test procedures for RRAMs

Requirements:

• Basic understanding of memristive devices and testing theory
• Strong knowledge in CMOS technology - microelectronics
• Strong knowledge in circuit simulation (such as HSPICE)

Person to Contact: Prof. Dr. Leticia Maria Bolzani Poehls

Inside the RWTH network you can find more detailed information here.